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Monday, February 18, 2013

MF9222 MANUFACTURING METROLOGY AND QUALITY CONTROL SYLLABUS | ANNA UNIVERSITY ME MANUFACTURING ENGINEERING 2ND SEMESTER SYLLABUS REGULATION 2009 2011 2012-2013

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MF9222 MANUFACTURING METROLOGY AND QUALITY CONTROL SYLLABUS | ANNA UNIVERSITY ME MANUFACTURING ENGINEERING 2ND SEMESTER SYLLABUS REGULATION 2009 2011 2012-2013 BELOW IS THE ANNA UNIVERSITY M.E MANUFACTURING ENGINEERING DEPARTMENT 2ND Sem SYLLABUS, TEXTBOOKS, REFERENCE BOOKS,EXAM PORTIONS,QUESTION BANK,PREVIOUS YEAR QUESTION PAPERS,MODEL QUESTION PAPERS, CLASS NOTES, IMPORTANT 2 MARKS, 8 MARKS, 16 MARKS TOPICS. IT IS APPLICABLE FOR ALL STUDENTS ADMITTED IN THE YEAR 2011 2012-2013 (ANNA UNIVERSITY CHENNAI, TRICHY, MADURAI, TIRUNELVELI, COIMBATORE), 2009 REGULATION OF ANNA UNIVERSITY CHENNAI AND STUDENTS ADMITTED IN ANNA UNIVERSITY CHENNAI DURING 2010

MF9222 MANUFACTURING METROLOGY AND QUALITY CONTROL L T P C
3 0 0 3
AIM:
To expose the students, the importance of measurement and the various latest
measuring techniques using Laser, Coordinate measuring machines and Optoelectronics
devices. Also to stress upon the Importance of quality in manufacturing.
OBJECTIVES:
To impart through knowledge in various latest measurement systems such as laser
metrology, coordinate measuring machines and electro-optical devices. Also to make the
students to understand quality
UNIT I LASER METROLOGY 8
Introduction – types of lasers – laser in engineering metrology – metrological laser
methods for applications in machine systems – Interferometry applications – speckle
interferometry – laser interferometers in manufacturing and machine tool alignment
testing – calibration systems for industrial robots laser Doppler technique – laser Doppler
anemometry.
UNIT II PRECISION INSTRUMENTS BASED ON LASER 9
Laser telemetric systems – detection of microscopic imperfections on high quality
surface Pitter NPL gauge interferometer – classification of optical scanning systems –
high inertia laser scan technique – rotating mirror technique – laser gauging – bar coding
– laser dimensional measurement system.
UNIT III CO-ORDINATE MEASURING MACHINE 10
Co-ordinate metrology – CMM configurations – hardware components – software –
Probe sensors – displacement devices – Performance Evaluations – Software –
Hardware – Dynamic errors – Thermal effects diagram – temperature variations
environment control – applications.
UNIT IV OPTO ELECTRONICS AND VISION SYSTEM 9
Opto electronic devices – CCD – On-line and in-process monitoring in production –
applications image analysis and computer vision – Image analysis techniques – spatical
feature – Image extraction – segmentation – digital image processing – Vision system
for measurement – Comparison laser scanning with vision system.
UNIT V QUALITY IN MANUFACTURING ENGINEERING 9
Importance of manufacturing planning for quality – concepts of controllability – need for
quality management system and models – quality engineering tools and techniques –
statistical process control – six sigma concepts – Poka Yoke – Computer controlled
systems used in inspection.
TOTAL: 45 PERIODS
REFERENCES:
1. John A. Bosch, Giddings and Lewis Dayton, Co-ordinate Measuring Machines and
Systems, Marcel Dekker, Inc, 1999.
2. Juran J.M. and Gyna F.M., Quality Planning and Analysis, Tata-McGraw Hill, New
Delhi
3. Zuech, Nello Understanding and Applying Machine Vision, Marcel Dekker, Inc, 2000
4. Elanchezhian.C, Vijaya Ramnath.B and Sunder Selwyn, T., Engineering Metrology,
Eswar Press, Chennai, 2004.

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