CI 9263 TECHNIQUES OF MATERIAL CHARACTERIZATION SYLLABUS | ANNA UNIVERSITY ME COMPUTER INTEGRATED MANUFACTURING ELECTIVES SYLLABUS REGULATION 2009 2011 2012-2013 BELOW IS THE ANNA UNIVERSITY M.E COMPUTER INTEGRATED MANUFACTURING DEPARTMENT ELECTIVES SYLLABUS, TEXTBOOKS, REFERENCE BOOKS,EXAM PORTIONS,QUESTION BANK,PREVIOUS YEAR QUESTION PAPERS,MODEL QUESTION PAPERS, CLASS NOTES, IMPORTANT 2 MARKS, 8 MARKS, 16 MARKS TOPICS. IT IS APPLICABLE FOR ALL STUDENTS ADMITTED IN THE YEAR 2011 2012-2013 (ANNA UNIVERSITY CHENNAI,TRICHY,MADURAI,TIRUNELVELI,COIMBATORE), 2009 REGULATION OF ANNA UNIVERSITY CHENNAI AND STUDENTS ADMITTED IN ANNA UNIVERSITY CHENNAI DURING 2010
CI 9263 TECHNIQUES OF MATERIAL CHARACTERIZATION L T P C
3 0 0 3 AIM:
This course aims at imparting knowledge on various techniques of material
characterization.
OBJECTIVES:
On completion of the course the students are expected to be knowledgeable in
microstructure evaluation, crystal structure analysis, electron microscopy, static and
dynamic mechanical testing methods.
UNIT I MICTRO STRUCTURAL EVALUATION 9
Principles of Optical Microscopy – Specimen Preparation Techniques – Polishing and
Etching – Polarization Techniques – Quantitative Metallography – Estimation of grain
size – ASTM grain size numbers – Microstructure of Engineering Materials.
UNIT II CRYSTALSTRUCTURE ANALYSIS: 9
Elements of Crystallography – X- ray Diffraction – Bragg’s law – Techniques of X-ray
Crystallography – Debye – Scherer camera – Geiger Diffractometer – analysis of
Diffraction patterns – Inter planer spacing – Identification of Crystal Structure,
Elements of Electron Diffraction.
UNIT III ELECTRON MICROSCOPY 9
Interaction of Electron Beam with Materials – Transmission Electron Microscopy –
Specimen Preparation – Imaging Techniques – BF & DF – SAD – Electron Probe
Microanalysis – Scanning Electron Microscopy – Construction & working of SEM –
various Imaging Techniques – Applications- Atomic Force Microscopy- Construction
& working of AFM - Applications .
UNIT IV MECHANICAL TESTING – STATIC TESTS: 9
Hardness – Brinell, Vickers, Rockwell and Micro Hardness Test – Tensile Test –
Stress – Strain plot – Proof Stress – Ductility Measurement – Impact Test – Charpy &
Izod.
UNIT V MECHANICAL TESTING – DYNAMIC TESTS 9
Fatigue – Low & High Cycle Fatigues – Rotating Beam & Plate Bending HCF tests –
S-N curve – LCF tests – Crack Growth studies – Creep Tests – LM parameters –
Applications of Dynamic Tests.
TOTAL: 45 PERIODS
21
TEXT BOOKS:
1. Culity B.D., Stock S.R& Stock S., Elements of X ray Diffraction, (3rd Edition).
Prentice Hall, 2001.
2. Dieter G.E., Mechanical Metallurgy, (3rd Edition), ISBN: 0070168938, McGraw
Hill, 1995.
3. Davis, H.E., Hauck G. & Troxell G.E., The Testing of engineering Materials, (4th
Edition), McGraw Hill, College Divn., 1982.
REFERENCES:
1. Goldsten,I.J., Dale.E., Echin.N.P.& Joy D.C., Scanning Electron Microscopy & X
ray- Micro Analysis, (2nd Edition), ISBN – 0306441756, Plenum Publishing Corp.,
2000.
2. Newby J., Metals Hand Book- Metallography & Micro Structures, (9th Edition),
ASM International, 1989.
3. Grundy P.J. and Jones G.A., Electron Microscopy in the Study of Materials,
Edward Arnold Limited, 1976.
4. Morita.S, Wiesendanger.R, and Meyer.E, “Noncontact Atomic Force Microscopy”
Springer, 2002
CI 9263 TECHNIQUES OF MATERIAL CHARACTERIZATION L T P C
3 0 0 3 AIM:
This course aims at imparting knowledge on various techniques of material
characterization.
OBJECTIVES:
On completion of the course the students are expected to be knowledgeable in
microstructure evaluation, crystal structure analysis, electron microscopy, static and
dynamic mechanical testing methods.
UNIT I MICTRO STRUCTURAL EVALUATION 9
Principles of Optical Microscopy – Specimen Preparation Techniques – Polishing and
Etching – Polarization Techniques – Quantitative Metallography – Estimation of grain
size – ASTM grain size numbers – Microstructure of Engineering Materials.
UNIT II CRYSTALSTRUCTURE ANALYSIS: 9
Elements of Crystallography – X- ray Diffraction – Bragg’s law – Techniques of X-ray
Crystallography – Debye – Scherer camera – Geiger Diffractometer – analysis of
Diffraction patterns – Inter planer spacing – Identification of Crystal Structure,
Elements of Electron Diffraction.
UNIT III ELECTRON MICROSCOPY 9
Interaction of Electron Beam with Materials – Transmission Electron Microscopy –
Specimen Preparation – Imaging Techniques – BF & DF – SAD – Electron Probe
Microanalysis – Scanning Electron Microscopy – Construction & working of SEM –
various Imaging Techniques – Applications- Atomic Force Microscopy- Construction
& working of AFM - Applications .
UNIT IV MECHANICAL TESTING – STATIC TESTS: 9
Hardness – Brinell, Vickers, Rockwell and Micro Hardness Test – Tensile Test –
Stress – Strain plot – Proof Stress – Ductility Measurement – Impact Test – Charpy &
Izod.
UNIT V MECHANICAL TESTING – DYNAMIC TESTS 9
Fatigue – Low & High Cycle Fatigues – Rotating Beam & Plate Bending HCF tests –
S-N curve – LCF tests – Crack Growth studies – Creep Tests – LM parameters –
Applications of Dynamic Tests.
TOTAL: 45 PERIODS
21
TEXT BOOKS:
1. Culity B.D., Stock S.R& Stock S., Elements of X ray Diffraction, (3rd Edition).
Prentice Hall, 2001.
2. Dieter G.E., Mechanical Metallurgy, (3rd Edition), ISBN: 0070168938, McGraw
Hill, 1995.
3. Davis, H.E., Hauck G. & Troxell G.E., The Testing of engineering Materials, (4th
Edition), McGraw Hill, College Divn., 1982.
REFERENCES:
1. Goldsten,I.J., Dale.E., Echin.N.P.& Joy D.C., Scanning Electron Microscopy & X
ray- Micro Analysis, (2nd Edition), ISBN – 0306441756, Plenum Publishing Corp.,
2000.
2. Newby J., Metals Hand Book- Metallography & Micro Structures, (9th Edition),
ASM International, 1989.
3. Grundy P.J. and Jones G.A., Electron Microscopy in the Study of Materials,
Edward Arnold Limited, 1976.
4. Morita.S, Wiesendanger.R, and Meyer.E, “Noncontact Atomic Force Microscopy”
Springer, 2002
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