ML3006 ELECTRON MICROSCOPY AND DIFFRACTION ANALYSIS OF MATERIALS SYLLABUS | ANNA UNIVERSITY BE MATERIALS SCIENCE AND ENGINEERING 8TH SEMESTER SYLLABUS REGULATION 2008 2011 2012-2013 BELOW IS THE ANNA UNIVERSITY 8TH SEMESTER B.E MATERIALS SCIENCE ENGINEERING DEPARTMENT SYLLABUS, TEXTBOOKS, REFERENCE BOOKS,EXAM PORTIONS,QUESTION BANK,PREVIOUS YEAR QUESTION PAPERS,MODEL QUESTION PAPERS, CLASS NOTES, IMPORTANT 2 MARKS, 8 MARKS, 16 MARKS TOPICS. IT IS APPLICABLE FOR ALL STUDENTS ADMITTED IN THE YEAR 2011 2012-2013 (ANNA UNIVERSITY CHENNAI,TRICHY,MADURAI, TIRUNELVELI,COIMBATORE), 2008 REGULATION OF ANNA UNIVERSITY CHENNAI AND STUDENTS ADMITTED IN ANNA UNIVERSITY CHENNAI DURING 2009
ML3006 ELECTRON MICROSCOPY AND DIFFRACTION ANALYSIS OF MATERIALS L T P C
3 0 0 3
OBJECTIVE
64
The study of microstructure and microscopic properties are important tools for the
understanding of material behaviour. This course covers, crystal structure, X-Ray
methods and spectroscopy as well as scanning and transmission electron microscopy.
UNIT I CRYSTALLOGRAPHY 7
Symmetry elements, operations – translational symmetries – point groups – space
groups – close packed structures – voids – important crystal structures – defects in
crystals – polymorphism and twinning – polarizing microscope and uses.
UNIT II DIFFRACTION AND CHARACTERISTICS X-RAYS 9
X-ray generation, properties – sealed tube, rotating anode, synchrotron radiation –
absorption – filters and monochromators. Atomic scattering factor. Fourier
transformation and structure factor – anomalous dispersion – Bragg’s law – reciprocal
lattice concept – Laue conditions – Ewald and limiting spheres – diffraction symmetry.
UNIT III SINGLE CRYSTAL DIFFRACTION 10
Laue, rotation / oscillation methods – interpretation of diffraction patterns – cell
parameter determination – indexing – Powder diffraction: Debye method – uses. Single
crystal X-ray diffractometer – double crystal X-ray diffractometer – Triple and four crystal
X-ray diffractometer. X-ray topography – Neutron diffraction.
UNIT IV SPECTROSCOPY 9
Principles and instrumentation for X-ray photoelectron spectroscopy (XPS), Auger
Electron spectroscopy (AES) and Secondary ion mass spectroscopy (SIJMS) – proton
induced X-ray Emission spectroscopy (PIXE)
UNIT V OPTICAL METHODS AND ELECTRON MICROSCOPY 10
Principles of SEM – instrumentation and working of SEM – Transmission Electron
Microscope (TEM) – Scanning transmission Electron Microscope (STEM) – principles,
instrumentation and working of Atomic force microscope (AFM) – Photoluminescence –
time resolved photoluminescence spectroscopy
TOTAL : 45 PERIODS
TEXT BOOKS
1. Lawrence E. Murr, “Electron and ion microscopy and microanalysis principles and
applications”, Marcel Dekker Inc. New York 1991.
2. Cullity, B. D., “Elements of X-ray diffraction”, Addison-Wesley Company Inc., New
York, 3rd Edition, 2000.
REFERENCES
1. Belk, J. A,“Electron microscopy and microanalysis of crystalline materials”, Applied
Science Publishers, London, 1979.
2. Azaroff, L. V.,“Elements of X-ray Crystallography”, McGraw –Hill NY, 1968.
ML3006 ELECTRON MICROSCOPY AND DIFFRACTION ANALYSIS OF MATERIALS L T P C
3 0 0 3
OBJECTIVE
64
The study of microstructure and microscopic properties are important tools for the
understanding of material behaviour. This course covers, crystal structure, X-Ray
methods and spectroscopy as well as scanning and transmission electron microscopy.
UNIT I CRYSTALLOGRAPHY 7
Symmetry elements, operations – translational symmetries – point groups – space
groups – close packed structures – voids – important crystal structures – defects in
crystals – polymorphism and twinning – polarizing microscope and uses.
UNIT II DIFFRACTION AND CHARACTERISTICS X-RAYS 9
X-ray generation, properties – sealed tube, rotating anode, synchrotron radiation –
absorption – filters and monochromators. Atomic scattering factor. Fourier
transformation and structure factor – anomalous dispersion – Bragg’s law – reciprocal
lattice concept – Laue conditions – Ewald and limiting spheres – diffraction symmetry.
UNIT III SINGLE CRYSTAL DIFFRACTION 10
Laue, rotation / oscillation methods – interpretation of diffraction patterns – cell
parameter determination – indexing – Powder diffraction: Debye method – uses. Single
crystal X-ray diffractometer – double crystal X-ray diffractometer – Triple and four crystal
X-ray diffractometer. X-ray topography – Neutron diffraction.
UNIT IV SPECTROSCOPY 9
Principles and instrumentation for X-ray photoelectron spectroscopy (XPS), Auger
Electron spectroscopy (AES) and Secondary ion mass spectroscopy (SIJMS) – proton
induced X-ray Emission spectroscopy (PIXE)
UNIT V OPTICAL METHODS AND ELECTRON MICROSCOPY 10
Principles of SEM – instrumentation and working of SEM – Transmission Electron
Microscope (TEM) – Scanning transmission Electron Microscope (STEM) – principles,
instrumentation and working of Atomic force microscope (AFM) – Photoluminescence –
time resolved photoluminescence spectroscopy
TOTAL : 45 PERIODS
TEXT BOOKS
1. Lawrence E. Murr, “Electron and ion microscopy and microanalysis principles and
applications”, Marcel Dekker Inc. New York 1991.
2. Cullity, B. D., “Elements of X-ray diffraction”, Addison-Wesley Company Inc., New
York, 3rd Edition, 2000.
REFERENCES
1. Belk, J. A,“Electron microscopy and microanalysis of crystalline materials”, Applied
Science Publishers, London, 1979.
2. Azaroff, L. V.,“Elements of X-ray Crystallography”, McGraw –Hill NY, 1968.
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